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ICSE 2008

The effect of program and model structure on mc/dc test adequacy coverage

Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl

PDFDOI 10.1145/1368088.1368111dblp

Abstract

In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage.

BibTeX
@inproceedings{Rajan-al:ICSE08,
  author    = {Ajitha Rajan and
               Michael W. Whalen and
               Mats Per Erik Heimdahl},
  title     = {The effect of program and model structure on mc/dc test adequacy coverage},
  booktitle = {ICSE},
  pages     = {161--170},
  publisher = {{ACM}},
  year      = {2008},
}

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