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FGit: Fault-Guided Fine-Tuning for Code Generation

Lishui Fan, Zhongxin Liu, Haoye Wang, Lingfeng Bao, Xin Xia, Shanping Li

Abstract

Modern instruction-tuned large language models (LLMs) have made remarkable progress in code generation. However, these LLMs fine-tuned with standard supervised fine-tuning (SFT) sometimes generate plausible-looking but functionally incorrect code fails to emphasize the error-sensitive segments—specific code differences between correct implementations and similar incorrect variants. To address this problem, we propose Fault-Guided Fine-Tuning (FGit), a novel fine-tuning technique that enhances LLMs’ code generation by (1) extracting multi-granularity (line/token-level) differences between correct and incorrect yet similar implementations to identify error-sensitive segments, and (2) dynamically prioritizing those segments during training via dynamic loss weighting. Through extensive experiments on seven LLMs across three widely-used benchmarks, our method achieves an average relative improvement of 6.9% on pass@1, with some enhanced 6.7B LLMs outperforming closed-source models, e.g., GPT-3.5-Turbo. Furthermore, our fine-tuning technique demonstrates strong generalization with performance improvements ranging from 3.8% to 19.1% across diverse instruction-tuned LLMs, and our ablation studies confirm the contributions of different granularities of differences and hyperparameters.

BibTeX
@inproceedings{Fan-al:ASE25,
  author    = {Lishui Fan and
               Zhongxin Liu and
               Haoye Wang and
               Lingfeng Bao and
               Xin Xia and
               Shanping Li},
  title     = {{FGit:} {Fault-Guided} {Fine-Tuning} for Code Generation},
  booktitle = {ASE},
  pages     = {1338--1350},
  publisher = {{IEEE}},
  year      = {2025},
}

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