Applying combinatorial test data generation to big data applications

Nan Li, Yu Lei, Haider Riaz Khan, Jingshu Liu, Yun Guo

Abstract

Big data applications (e.g., Extract, Transform, and Load (ETL) applications) are designed to handle great volumes of data. However, processing such great volumes of data is time-consuming. There is a need to construct small yet effective test data sets during agile development of big data applications.

BibTeX

@inproceedings{Li-al:ASE16,
  author    = {Nan Li and
               Yu Lei and
               Haider Riaz Khan and
               Jingshu Liu and
               Yun Guo},
  title     = {Applying combinatorial test data generation to big data applications},
  booktitle = {ASE},
  pages     = {637--647},
  publisher = {{ACM}},
  year      = {2016},
}

Applying combinatorial test data generation to big data applications

Abstract

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