Test Sequences Generation from LUSTRE Descriptions: GATeL

DOI 10.1109/ase.2000.873667 dblp

Abstract

We describe a test sequence generation method from LUSTRE descriptions and its companion tool, GATEL. The LUSTRE language is declarative and describes synchronous data-flow computations. It is used for reactive control/command systems, mainly for electrical power production applications. Such critical applications require a high level of reliability. While this language benefits from powerful verification tools, there is still a demand for adequate testing techniques. The method and the tool described can be applied during unit and integration testing, according to a structural (glass box) or functional (black box) test selection strategy. The test generation tool uses some interpretation of the language constructs as boolean and integer interval constraints. Test sequence generation is automated using constraint logic programming techniques. The method and the tool are illustrated on an example extracted from an industrial case study.

BibTeX

@inproceedings{Marre-Arnould:ASE00,
  author    = {Bruno Marre and
               Agn{\`{e}}s Arnould},
  title     = {Test Sequences Generation from {LUSTRE} Descriptions: {GATeL}},
  booktitle = {ASE},
  pages     = {229-},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
}

Test Sequences Generation from LUSTRE Descriptions: GATeL

Abstract

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