Optimizing customized program coverage

Peter Ohmann, David Bingham Brown, Naveen Neelakandan, Jeff T. Linderoth, Ben Liblit

Abstract

Program coverage is used across many stages of software development. While common during testing, program coverage has also found use outside the test lab, in production software. However, production software has stricter requirements on run-time overheads, and may limit possible program instrumentation. Thus, optimizing the placement of probes to gather program coverage is important.

BibTeX

@inproceedings{Ohmann-al:ASE16,
  author    = {Peter Ohmann and
               David Bingham Brown and
               Naveen Neelakandan and
               Jeff T. Linderoth and
               Ben Liblit},
  title     = {Optimizing customized program coverage},
  booktitle = {ASE},
  pages     = {27--38},
  publisher = {{ACM}},
  year      = {2016},
}

Optimizing customized program coverage

Abstract

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