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ASE 2019

Test Automation and Its Limitations: A Case Study

Ahyoung Sung, Sangjun Kim, Yangsu Kim, Younggun Jang, Jongin Kim

DOI 10.1109/ase.2019.00139dblp

Abstract

Modern embedded systems are increasingly complex and contain multiple software layers from BSP (Board Support Packages) to OS to middleware to AI (Artificial Intelligence) algorithms like perception and voice recognition. Integrations of inter-layer and intra-layer in embedded systems provide dedicated services such as taking a picture or movie-streaming. Accordingly, it gets more complicated to find out the root cause of a system failure. This industrial proposal describes a difficulty of testing embedded systems, and presents a case study in terms of integration testing.

BibTeX
@inproceedings{Sung-al:ASE19,
  author    = {Ahyoung Sung and
               Sangjun Kim and
               Yangsu Kim and
               Younggun Jang and
               Jongin Kim},
  title     = {Test Automation and Its Limitations: A Case Study},
  booktitle = {ASE},
  pages     = {1208--1209},
  publisher = {{IEEE}},
  year      = {2019},
}

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