Using the Consequence of Failures for Testing and Reliability Assessment

Abstract

article Free Access Share on Using the consequence of failures for testing and reliability assessment Author: Elaine J. Weyuker AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJView Profile Authors Info & Claims ACM SIGSOFT Software Engineering NotesVolume 20Issue 4Oct. 1995 pp 81–91https://doi.org/10.1145/222132.222143Published:01 October 1995Publication History 8citation429DownloadsMetricsTotal Citations8Total Downloads429Last 12 Months14Last 6 weeks1 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF

BibTeX

@inproceedings{Weyuker:FSE95,
  author    = {Elaine J. Weyuker},
  title     = {Using the Consequence of Failures for Testing and Reliability Assessment},
  booktitle = {FSE},
  pages     = {81--91},
  publisher = {{ACM}},
  year      = {1995},
}

Using the Consequence of Failures for Testing and Reliability Assessment

Abstract

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