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Predicting Fault Prone Modules by the Dempster-Shafer Belief Networks

Lan Guo, Bojan Cukic, Harshinder Singh

Abstract

This paper describes a novel methodology for predicting fault prone modules. The methodology is based on Dempster-Shafer (D-S) belief networks. Our approach consists of three steps: First, building the Dempster-Shafer network by the induction algorithm; Second, selecting the predictors (attributes) by the logistic procedure; Third, feeding the predictors describing the modules of the current project into the inducted Dempster-Shafer network and identifying fault prone modules. We applied this methodology to a NASA dataset. The prediction accuracy of our methodology is higher than that achieved by logistic regression or discriminant analysis on the same dataset.

BibTeX
@inproceedings{Guo-al:ASE03,
  author    = {Lan Guo and
               Bojan Cukic and
               Harshinder Singh},
  title     = {Predicting Fault Prone Modules by the {Dempster-Shafer} Belief Networks},
  booktitle = {ASE},
  pages     = {249--252},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
}

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