JITO: a tool for just-in-time defect identification and localization
Abstract
In software development and maintenance, defect localization is necessary for software quality assurance. Current defect localization techniques mainly rely on defect symptoms (e.g., bug reports or program spectrum) when the defect has been exposed. One challenge task is: can we locate buggy program prior to the appearance of the defect symptom. Such kind of localization is conducted at an early stage (e.g., when buggy program elements are being checked-in) which can be an early step of continuous quality control.
BibTeX
@inproceedings{Qiu-al:FSE20,
author = {Fangcheng Qiu and
Meng Yan and
Xin Xia and
Xinyu Wang and
Yuanrui Fan and
Ahmed E. Hassan and
David Lo},
title = {{JITO:} a tool for just-in-time defect identification and localization},
booktitle = {{ESEC/SIGSOFT} {FSE}},
pages = {1586--1590},
publisher = {{ACM}},
year = {2020},
}